Measurement Modes
- Contact & Non-Contact AFM: Contact AFM, LFM, Resonant Mode (Semicontact/Dynamic + Noncontact AFM)
- Imaging & Analysis: Phase Imaging, Force Modulation (Viscoelasticity), MFM, EFM, Adhesion Force Imaging
- AFM Lithography: AFM Lithography-Force, AFM Lithography-Voltage
- Additional Imaging Techniques: Spreading Resistance Imaging (SRI), Scanning Capacitance Imaging (SCI), Scanning Kelvin Probe Microscopy (SKM), PFM
- Spectroscopy & Liquid Operation: Force Volume, F-d & I-V Spectroscopies, Operation in Liquid
Nanoeducator
- Universal AFM Head (for Solver Nano)
- Exchangeable probe holder for air and liquid operation
- Laser wavelength: 650 nm
- Can be used with heating unit (SU05ED) for air measurements
- Manual optical alignment system and optical access for a video microscope
- Acoustically isolated by enclosure head
- Base Unit of Nanoeducator II or Solver Nano SPM
- Manual sample positioning in XY directions (5×5 mm)
- Probe approach to sample and scanning (100×100×10 µm, Closed-Loop)
- Sample and probe positioning monitored via built-in video microscope
- Compatible with interchangeable measuring heads
Liquid Cell
- Exchangeable Probe Holder
- For liquid operation with the universal AFM head (Solver Nano)
- Includes open liquid cell
Scanning & Sample Specifications
- Scanning: By sample, range 100 × 100 × 10 µm (Closed Loop)
- Sample Positioning: Manual, range 5 × 5 mm
- Maximum Sample Weight: 40 g
- Sample Size:
- Diameter up to 25 mm
- Thickness up to 10 mm
